Dr. Kevin A. Grossklaus is a technical staff member in the Quantum-Enabled Computation Group at MIT Lincoln Laboratory. He works as part of the superconducting qubit fabrication team to evaluate material systems and develop new processing approaches for superconducting quantum devices. His expertise centers on the deposition and characterization of epitaxial thin films. Prior to joining MIT Lincoln Laboratory, Dr. Grossklaus was a research faculty member in the EECS department at Tufts University, where he managed the Tufts Epitaxial Core user facility. There his research focused on epitaxial growth of III-V and group IV semiconductor materials. Before moving to Tufts University, Dr. Grossklaus was a front-end thin film metals process development engineer in the Intel Corporation’s PTD group. Dr. Grossklaus received his Ph.D. in Materials Science and Engineering from the University of Michigan in 2012. He received his B.S. and M.S in Materials Science and Engineering from Purdue University.
Presentation Title:
Identifying and Reducing Sources of Loss in Superconducting Qubits Through Materials and Device Processing Choices
Presentation Abstract:
Superconducting qubits are a promising modality for quantum applications, including quantum computing. However, energy losses to materials, defects, interfaces, and surface layers are a significant limiter of qubit coherence time and gate fidelities. As a result, when changing materials and associated fabrication processes sources of loss need to be specifically considered. Here we present the basic structure of superconducting qubits in use at MIT Lincoln Laboratory, as well as several ongoing efforts to identify and reduce sources of loss from both qubit materials and the methods used to process them. These include examples of mitigating sources of loss during creation of Josephson junctions, examining different choices of superconducting base metal, and probing loss from superconducting device substrates.
This material is based upon work supported under Air Force Contract No. FA8702-15-D-0001 or FA8702-25-D-B002. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. Air Force.