Nondestructive Evaluation for Advanced Manufacturing Workshop

Agenda

Day 1

Tuesday, May 19, 2026

TimeEventSpeaker(s)Location
7:30am - 8:00amRegistration/Badge pickupMDF Lobby
8:00am - 8:15amWelcomeJoe Hoagland - ORNL, Ryan Meyer - ORNLMDF 112A/112B
8:15am – 8:30amOpening BriefRyan Meyer – ORNLMDF 112A/112B
8:30am - 9:00amKeynoteShant Kendarian - The Aerospace CorporationMDF 112A/112B
9:00am - 10:55amSession 1 - NDE for AM: Current Challenges and the State of the ArtMDF 112A/112B
9:00am - 9:20amSession 1.1Meimei Li - DOE AMMTMDF 112A/112B
9:20am - 9:40amSession 1.2James Kemp - DOE AMMTOMDF 112A/112B
9:40am - 10:00amSession 1.3Stephen Cumblidge - NRCMDF 112A/112B
10:00am - 10:10amGroup PhotoMDF
10:10am - 10:20amBreakMDF 112A/112B
10:20am - 11:05amSession 1 Panel DiscussionMeimei Li - DOE AMMT, James Kemp - DOE AMMTO, Stephen Cumblidge - NRC, Bruce Greer - EPRI, Craig Gerardi - KairosMDF 112A/112B
11:05am - 12:10pmSession 2 - AI/ML ApplicationsMDF 112A/112B
11:05am - 11:20amUnsupervised Learning Enabled Pulsed Infrared Thermographic Microscopy of Subsurface Defects in Stainless SteelAlexander Heifetz - Argonne National LaboratoryMDF 112A/112B
11:20am - 11:35amSimurgh: AI-Powered Fast and Accurate X-Ray CT Reconstruction and Super-resolution for High-Throughput NDE in advanced ManufacturingObaid Rahman – ORNLMDF 112A/112B
11:35am - 11:40amLightning Talk: Machine learning approach for 3D acoustic emission (AE) source localization in additively manufactured metals Jinying Zhu - University of Nebraska - LincolnMDF 112A/112B
11:40am - 11:45amLightning Talk: Seeing the Invisible: Non-Destructive Testing with IRIS aiOne Andrew Dougherty - RDI TechnologiesMDF 112A/112B
11:45am - 12:10pmSession 2 Panel DiscussionAlexander Heifetz – ANL, Obaid Rahman – ORNL, Jinying Zhu – University of Nebraska, Lincoln, Andrew Dougherty – RDI TechnologiesMDF 112A/112B
12:10pm - 1:10pmWorking LunchSrinivas Tadepalli - NvidiaMDF 112A/112B
1:10pm - 2:50pmSession 3 - Ex-Situ NDEMDF 112A/112B
1:10pm - 1:25pmNDE approaches for inspecting components fabricated using solid phase processing Richard Jacob - PNNLMDF 112A/112B
1:25pm - 1:40pmThe Next Generation of CTShane Sunkin - VisiConsultMDF 112A/112B
1:40pm - 1:55pmTime-of-Flight Neutron Imaging of Additively Manufactured Components: a new tool to measure structural defects, phase and strain mapping at the Oak Ridge National Laboratory Spallation Neutron Source VENUS FacilityHassina Bilheux - ORNLMDF 112A/112B
1:55pm - 2:10pmHigh Energy X-ray Computed Tomography and multimodal imagingDayakar Penumadu - University of Tennessee, KnoxvilleMDF 112A/112B
2:10pm - 2:35pmSession 3 Panel DiscussionRichard Jacob – PNNL, Shane Sunkin – VisiConsult, Hassina Bilheux – ORNL, Dayakar Penumadu – University of Tennessee, KnoxvilleMDF
2:35pm - 3:30pmSession 4 - Qualification and Certification UpdatesMDF
2:35pm - 2:50pmNDE Best Practice in Voluntary Consensus Standards for Metal Additive Manufactured PartsJesse Waller - New Mexico State UniversityMDF 112A/112B
2:50pm - 2:55pmLightning Talk: Nondestructive Testing for NAVSEA AdditiveCraig Sheppard - NAVSEA 05P2 (NDT)MDF 112A/112B
2:55pm - 3:00pmSession 4.3 Lightning TalkEmily Currier - NAVAIRMDF 112A/112B
3:00pm - 3:05pmLightning Talk - ARP7065: Standardizing In Situ Process Monitoring Taxonomy for Future Qualification FrameworksTyler LeBrun - TGBAMDF 112A/112B
3:05pm - 3:30pmSession 4 Panel DiscussionJesse Waller – New Mexico State University, Craig Sheppard – NAVSEA 05P2 (NDT), Emily Currier – NAVAIR, Tyler LeBrun – TBGAMDF 112A/112B
3:30pm - 4:40pmBreakout (Day 1 Topics)Ryan Meyer - ORNL, Ryan Spencer - ORNL, Ahmed Hassen - ORNL, Amir Ziabari - ORNL, Pradeep Ramuhalli - ORNLMDF, Group 1 – 112A Group 2 – 112B Group 3 – 112B Group 4 – 112C Group 5 – 304 Group 6 – 305 Group 7 – 309 Group 8 – 325
4:40pm - 4:50pmDay 1 ConclusionsAhmed Hassen - ORNLMDF 112A/112B
4:50p - 5:00pBreak/Transition to Working Reception in Lieu of Dinner/Poster SessionMDF
5:00pm - 6:20pmWorking Reception in Lieu of Dinner/Poster SessionSandesh Giri (University of Louisiana at Lafayette), Hossein Taheri (Georgia Southern University), Sen Liu (University of Louisiana at Lafayette), Hannah Vazquez (University of Dayton Research Institute), Adwoa Owusu (University of Tennessee, Knoxville), Xiao Xinyi (University of N. Texas), William Werner (University of Tennessee, Knoxville)MDF 112A/112B

Day 2

Wednesday, May 20, 2026

TimeEventSpeaker(s)Location
8:00am - 9:20amMDF TourMDF Lobby
9:20am - 9:30amReview of Day 1Ryan Meyer - ORNL, Pradeep Ramuhalli - ORNLMDF 112A/112B
9:30am - 11:15amSession 5 - In-situ NDE/MonitoringMDF 112A/112B
9:30am - 9:45amIn-situ NDE During Additive ManufacturingPaul Panetta - The Aerospace CorporationMDF 112A/112B
9:45am - 10:00amThermal Imaging to identify subsurface porosity of metal componentsEric MacDonald - University of Texas, El PasoMDF 112A/112B
10:00am - 10:15amMiniaturized inspection probes without friction limitations in harsh environmentsMihai Duduta - University of ConneticutMDF 112A/112B
10:15am - 10:30amIn-situ PODZachary Snow - ORNLMDF 112A/112B
10:30am - 10:45am Electrical tomography methods for non-invasive monitoring and NDE of manufacturing processesTyler Tallman – Purdue UniversityMDF 112A/112B
10:45am - 10:50amLightning Talk: Ultrafast solidification signatures in Cu: time-resolved SAXS/WAXS observations and molecular dynamics interpretation across laser-relevant cooling ratesSandesh Giri - University of Louisiana at LafayetteMDF 112A/112B
10:50am - 11:15amSession 5 Panel DiscussionPaul Panetta – The Aerospace Corporation, Eric MacDonald – UTEP, Mihai Duduta – University of Connecticut, Zachary Snow – ORNL, Tyler Tallman – Purdue University, Sandesh Giri –University of Louisiana at LafayetteMDF 112A/112B
11:15am - 1:25pmSession 6 - Digital Infrastructure for NDE AutomationMDF 112A/112B
11:15am - 11:30amManagement of Digital NDT RecordsGregory Mohr - MIB/SercoMDF 112A/112B
11:30am -11:45amDesigned to Evolve: Obsolescence-Resistant vs Planned-Obsolescence in NDEAbhishek Shukla - UTEX ScientificMDF 112A/112B
11:45am - 12:00pmAccommodating inconsistent geometries for mapping NDE data in the digital thread/digital twinSteve Holland - CNDEMDF 112A/112B
12:00pm - 12:15pmDamara Tern: A data management platform for advanced manufacturingStephanie Cooper - ORNLMDF 112A/112B
12:15pm - 1:15pmWorking Lunch/Attendee Polling SessionAmir Ziabari - ORNL, Pradeep Ramuhalli - ORNLMDF 112A/112B
1:15pm - 1:40pmSession 6 Panel DiscussionGregory Mohr – MIB/Serco, Abhishek Shukla – UTEX Scientific, Steve Holland – CNDE, Stephanie Cooper – ORNLMDF 112A/112B
1:40pm - 2:50pmSession 7 - Rapid Qualification to Enable Automated WorkflowsMDF 112A/112B
1:40pm - 1:55pmFrom Monitoring to Quality: Using Multi-Sensor Process Signatures for Rapid AM Quality AssessmentShuchi Khurana - AddiguruMDF 112A/112B
1:55pm - 2:10pmExpedite LPBF Qualification via Multimodal In-situ Monitoring & Closed-Loop ControlYash Parikh - EOS of North America, Inc.MDF 112A/112B
2:10pm - 2:25pmAI-enabled high-throughput time-resolved XCT workflow for interrupted creep of LPBF partsRahul Franklin - ORNLMDF 112A/112B
2:25pm - 2:50pmSession 7 Panel DiscussionShuchi Khurana - Addiguru, Yash Parikh - EOS of North America, Inc., Rahul Franklin - ORNLMDF 112A/112B
2:50pm - 4:00pmBreakout (Day 2 Topics)Ryan Meyer - ORNL, Ryan Spencer - ORNL, Amir Zaibari - ORNL, Pradeep Ramuhalli - ORNLMDF, Group 1 – 112A Group 2 – 112B Group 3 – 112B Group 4 – 112C Group 5 – 113 Group 6 – 311 Group 7 – 305 Group 8 – 309
4:00pm - 4:45pmBreakout Summaries - Day 1 and Day 2Ryan Meyer - ORNL, Ryan Spencer - ORNL, Amir Zaibari - ORNL, Pradeep Ramuhalli - ORNLMDF 112A/112B
4:45pm - 5:00pmConclusion and Next StepsPradeep Ramuhalli - ORNLMDF 112A/112B
5:00pmAdjournRyan Meyer - ORNLMDF 112A/112B
NDE for AM Workshop 2026 Agenda as of May 14_2026Download